A Study of BER, EVM, and OOBE Degradation in Transceivers Incorporating Digital Modulation Schemes Due to Noise and Non-Linearity

9789310009304

Santosh Rastogi

Vishwa Jyoti Press

English

Systems Engineering: Communication, Electrical and Elecronics - Systems Engineering: Communication, Electrical and Elecronics

2024

11150.00

A Study of BER, EVM, and OOBE Degradation in Transceivers Incorporating Digital Modulation Schemes Due to Noise and Non-Linearity